An Online Condition Monitoring Method for IGBT Gate Oxide Degradation Based on the Gate Current in Miller Plateau

Allahyar Moazami, Sadegh Mohsenzade, Khatereh Akbari. An Online Condition Monitoring Method for IGBT Gate Oxide Degradation Based on the Gate Current in Miller Plateau. IEEE Transactions on Industrial Electronics, 70(9):9505-9514, September 2023. [doi]

Abstract

Abstract is missing.