Learning from artifacts: metadata utilization analysis - researchr publication authors

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William E. Moen, Shawne D. Miksa, Amy Eklund, Serhiy Polyakov, Gregory Snyder. Learning from artifacts: metadata utilization analysis. In Gary Marchionini, Michael L. Nelson, Catherine C. Marshall, editors, ACM/IEEE Joint Conference on Digital Libraries, JCDL 2006, Chapel Hill, NC, USA, June 11-15, 2006, Proceedings. pages 270-271, ACM, 2006. [doi]

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