William E. Moen, Shawne D. Miksa, Amy Eklund, Serhiy Polyakov, Gregory Snyder. Learning from artifacts: metadata utilization analysis. In Gary Marchionini, Michael L. Nelson, Catherine C. Marshall, editors, ACM/IEEE Joint Conference on Digital Libraries, JCDL 2006, Chapel Hill, NC, USA, June 11-15, 2006, Proceedings. pages 270-271, ACM, 2006. [doi]
@inproceedings{MoenMEPS06, title = {Learning from artifacts: metadata utilization analysis}, author = {William E. Moen and Shawne D. Miksa and Amy Eklund and Serhiy Polyakov and Gregory Snyder}, year = {2006}, doi = {10.1145/1141753.1141813}, url = {http://doi.acm.org/10.1145/1141753.1141813}, tags = {analysis}, researchr = {https://researchr.org/publication/MoenMEPS06}, cites = {0}, citedby = {0}, pages = {270-271}, booktitle = {ACM/IEEE Joint Conference on Digital Libraries, JCDL 2006, Chapel Hill, NC, USA, June 11-15, 2006, Proceedings}, editor = {Gary Marchionini and Michael L. Nelson and Catherine C. Marshall}, publisher = {ACM}, isbn = {1-59593-354-9}, }