Elham K. Moghaddam, Shaahin Hessabi. An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits. In Tenth Euromicro Conference on Digital System Design: Architectures, Methods and Tools (DSD 2007), 29-31 August 2007, Lübeck, Germany. pages 619-625, IEEE, 2007. [doi]
Abstract is missing.