Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab. At-speed scan test with low switching activity. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 177-182, IEEE Computer Society, 2010. [doi]
Abstract is missing.