Naouel Moha, Yann-Gaël Guéhéneuc. P<scp>TIDEJ</scp> and D<scp>ECOR</scp>: identification of design patterns and design defects. In Richard P. Gabriel, David F. Bacon, Cristina Videira Lopes, Guy L. Steele Jr., editors, Companion to the 22nd Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2007, October 21-25, 2007, Montreal, Quebec, Canada. pages 868-869, ACM, 2007. [doi]
Abstract is missing.