Automatic Generation of Detection Algorithms for Design Defects

Naouel Moha, Yann-Gaël Guéhéneuc, Pierre Leduc. Automatic Generation of Detection Algorithms for Design Defects. In 21st IEEE/ACM International Conference on Automated Software Engineering (ASE 2006), 18-22 September 2006, Tokyo, Japan. pages 297-300, IEEE Computer Society, 2006. [doi]

Abstract

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