Hassan Ghasemzadeh Mohammadi, Pierre-Emmanuel Gaillardon, Giovanni De Micheli. Fault modeling in controllable polarity silicon nanowire circuits. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 453-458, ACM, 2015. [doi]
Abstract is missing.