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The Impact of the Scaled-Down CMOS Technologies on the Step Response Degradation Caused by the Pole-Zero Doublets in the OTAs

Mahmood A. Mohammed, Gordon W. Roberts. The Impact of the Scaled-Down CMOS Technologies on the Step Response Degradation Caused by the Pole-Zero Doublets in the OTAs. In 11th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2020, San Jose, Costa Rica, February 25-28, 2020. pages 1-4, IEEE, 2020. [doi]

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Mahmood A. Mohammed

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Gordon W. Roberts

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