Mahmood A. Mohammed, Gordon W. Roberts. The Impact of the Scaled-Down CMOS Technologies on the Step Response Degradation Caused by the Pole-Zero Doublets in the OTAs. In 11th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2020, San Jose, Costa Rica, February 25-28, 2020. pages 1-4, IEEE, 2020. [doi]
@inproceedings{MohammedR20,
title = {The Impact of the Scaled-Down CMOS Technologies on the Step Response Degradation Caused by the Pole-Zero Doublets in the OTAs},
author = {Mahmood A. Mohammed and Gordon W. Roberts},
year = {2020},
doi = {10.1109/LASCAS45839.2020.9069003},
url = {https://doi.org/10.1109/LASCAS45839.2020.9069003},
researchr = {https://researchr.org/publication/MohammedR20},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {11th IEEE Latin American Symposium on Circuits & Systems, LASCAS 2020, San Jose, Costa Rica, February 25-28, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3427-7},
}