A zero suppressed binary decision diagram-based test set relaxation for single and multiple stuck-at faults

Navya Mohan, J. P. Anita. A zero suppressed binary decision diagram-based test set relaxation for single and multiple stuck-at faults. IJMNO, 7(1):83-96, 2016. [doi]

Authors

Navya Mohan

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J. P. Anita

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