Navya Mohan, J. P. Anita. A zero suppressed binary decision diagram-based test set relaxation for single and multiple stuck-at faults. IJMNO, 7(1):83-96, 2016. [doi]
@article{MohanA16,
title = {A zero suppressed binary decision diagram-based test set relaxation for single and multiple stuck-at faults},
author = {Navya Mohan and J. P. Anita},
year = {2016},
doi = {10.1504/IJMMNO.2016.074374},
url = {http://dx.doi.org/10.1504/IJMMNO.2016.074374},
researchr = {https://researchr.org/publication/MohanA16},
cites = {0},
citedby = {0},
journal = {IJMNO},
volume = {7},
number = {1},
pages = {83-96},
}