A Code Transition Delay Model for ADC Test

Sanjay Mohan, Michael L. Bushnell. A Code Transition Delay Model for ADC Test. In 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India. pages 274-282, IEEE Computer Society, 2001. [doi]

Authors

Sanjay Mohan

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Michael L. Bushnell

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