Control techniques for high-speed dynamic mode imaging in atomic force microscopes

Gayathri Mohan, Chibum Lee, Srinivasa M. Salapaka. Control techniques for high-speed dynamic mode imaging in atomic force microscopes. In Proceedings of the 50th IEEE Conference on Decision and Control and European Control Conference, CDC-ECC 2011, Orlando, FL, USA, December 12-15, 2011. pages 651-656, IEEE, 2011. [doi]

Abstract

Abstract is missing.