Sundarar Mohan, Pinaki Mazumder. Fault Modeling and Testing of GaAs Static Random Access Memories. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 665-674, IEEE Computer Society, 1991.
@inproceedings{MohanM91,
title = {Fault Modeling and Testing of GaAs Static Random Access Memories},
author = {Sundarar Mohan and Pinaki Mazumder},
year = {1991},
tags = {modeling, testing, random testing},
researchr = {https://researchr.org/publication/MohanM91},
cites = {0},
citedby = {0},
pages = {665-674},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}