Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry

Niladri Narayan Mojumder, Saibal Mukhopadhyay, Jae-Joon Kim, Ching-Te Chuang, Kaushik Roy. Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 101-106, IEEE Computer Society, 2008. [doi]

Authors

Niladri Narayan Mojumder

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Saibal Mukhopadhyay

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Jae-Joon Kim

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Ching-Te Chuang

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Kaushik Roy

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