Niladri Narayan Mojumder, Saibal Mukhopadhyay, Jae-Joon Kim, Ching-Te Chuang, Kaushik Roy. Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 101-106, IEEE Computer Society, 2008. [doi]
@inproceedings{MojumderMKCR08,
title = {Design and Analysis of a Self-Repairing SRAM with On-Chip Monitor and Compensation Circuitry},
author = {Niladri Narayan Mojumder and Saibal Mukhopadhyay and Jae-Joon Kim and Ching-Te Chuang and Kaushik Roy},
year = {2008},
doi = {10.1109/VTS.2008.26},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.26},
tags = {analysis, design},
researchr = {https://researchr.org/publication/MojumderMKCR08},
cites = {0},
citedby = {0},
pages = {101-106},
booktitle = {26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA},
publisher = {IEEE Computer Society},
}