Björn Möller, Jan Pirklbauer, Marvin Klingner, Peer Kasten, Markus Etzkorn, Tim J. Seifert, Uta Schlickum, Tim Fingscheidt. A Super-Resolution Training Paradigm Based on Low-Resolution Data Only to Surpass the Technical Limits of STEM and STM Microscopy. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 - Workshops, Vancouver, BC, Canada, June 17-24, 2023. pages 4263-4272, IEEE, 2023. [doi]
@inproceedings{MollerPKKESSF23,
title = {A Super-Resolution Training Paradigm Based on Low-Resolution Data Only to Surpass the Technical Limits of STEM and STM Microscopy},
author = {Björn Möller and Jan Pirklbauer and Marvin Klingner and Peer Kasten and Markus Etzkorn and Tim J. Seifert and Uta Schlickum and Tim Fingscheidt},
year = {2023},
doi = {10.1109/CVPRW59228.2023.00449},
url = {https://doi.org/10.1109/CVPRW59228.2023.00449},
researchr = {https://researchr.org/publication/MollerPKKESSF23},
cites = {0},
citedby = {0},
pages = {4263-4272},
booktitle = {IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 - Workshops, Vancouver, BC, Canada, June 17-24, 2023},
publisher = {IEEE},
isbn = {979-8-3503-0249-3},
}