Björn Möller, Jan Pirklbauer, Marvin Klingner, Peer Kasten, Markus Etzkorn, Tim J. Seifert, Uta Schlickum, Tim Fingscheidt. A Super-Resolution Training Paradigm Based on Low-Resolution Data Only to Surpass the Technical Limits of STEM and STM Microscopy. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 - Workshops, Vancouver, BC, Canada, June 17-24, 2023. pages 4263-4272, IEEE, 2023. [doi]
Abstract is missing.