Detection and localization of appearance faults in reversible circuits - researchr publication authors

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Bappaditya Mondal, Chandan Bandyopadhyay, Hafizur Rahaman. Detection and localization of appearance faults in reversible circuits. In 7th International Symposium on Embedded Computing and System Design, ISED 2017, Durgapur, India, December 18-20, 2017. pages 1-5, IEEE, 2017. [doi]

This author has not been identified. Look up 'Bappaditya Mondal' in GoogleThis author has not been identified. Look up 'Chandan Bandyopadhyay' in GoogleThis author has not been identified. Look up 'Hafizur Rahaman' in Google

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