Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test - researchr publication authors

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Manobendra Nath Mondal, Animesh Basak Chowdhury, Manjari Pradhan, Susmita Sur-Kolay, Bhargab B. Bhattacharya. Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test. In 28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019. pages 25-30, IEEE, 2019. [doi]

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