Manobendra Nath Mondal, Animesh Basak Chowdhury, Manjari Pradhan, Susmita Sur-Kolay, Bhargab B. Bhattacharya. Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test. In 28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019. pages 25-30, IEEE, 2019. [doi]
@inproceedings{MondalCPSB19,
title = {Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test},
author = {Manobendra Nath Mondal and Animesh Basak Chowdhury and Manjari Pradhan and Susmita Sur-Kolay and Bhargab B. Bhattacharya},
year = {2019},
doi = {10.1109/ATS47505.2019.000-5},
url = {https://doi.org/10.1109/ATS47505.2019.000-5},
researchr = {https://researchr.org/publication/MondalCPSB19},
cites = {0},
citedby = {0},
pages = {25-30},
booktitle = {28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019},
publisher = {IEEE},
isbn = {978-1-7281-2695-1},
}