Joyati Mondal, Debesh Kumar Das, Dipak K. Kole, Hafizur Rahaman, Bhargab B. Bhattacharya. On Designing Testable Reversible Circuits Using Gate Duplication. In Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, Dharmendra Boolchandani, Virendra Singh, Adit D. Singh, editors, VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers. Volume 382 of Communications in Computer and Information Science, pages 322-329, Springer, 2013. [doi]
@inproceedings{MondalDKRB13,
title = {On Designing Testable Reversible Circuits Using Gate Duplication},
author = {Joyati Mondal and Debesh Kumar Das and Dipak K. Kole and Hafizur Rahaman and Bhargab B. Bhattacharya},
year = {2013},
doi = {10.1007/978-3-642-42024-5_38},
url = {http://dx.doi.org/10.1007/978-3-642-42024-5_38},
researchr = {https://researchr.org/publication/MondalDKRB13},
cites = {0},
citedby = {0},
pages = {322-329},
booktitle = {VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers},
editor = {Manoj Singh Gaur and Mark Zwolinski and Vijay Laxmi and Dharmendra Boolchandani and Virendra Singh and Adit D. Singh},
volume = {382},
series = {Communications in Computer and Information Science},
publisher = {Springer},
isbn = {978-3-642-42024-5},
}