Joyati Mondal, Debesh Kumar Das, Dipak K. Kole, Hafizur Rahaman, Bhargab B. Bhattacharya. On Designing Testable Reversible Circuits Using Gate Duplication. In Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, Dharmendra Boolchandani, Virendra Singh, Adit D. Singh, editors, VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers. Volume 382 of Communications in Computer and Information Science, pages 322-329, Springer, 2013. [doi]
Abstract is missing.