DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits

Joyati Mondal, Dipak Kumar Kole, Hafizur Rahaman 0001, Debesh Kumar Das, Bhargab B. Bhattacharya. DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits. Journal of Circuits, Systems, and Computers, 31(10), 2022. [doi]

@article{MondalKRDB22,
  title = {DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits},
  author = {Joyati Mondal and Dipak Kumar Kole and Hafizur Rahaman 0001 and Debesh Kumar Das and Bhargab B. Bhattacharya},
  year = {2022},
  doi = {10.1142/S0218126622501286},
  url = {https://doi.org/10.1142/S0218126622501286},
  researchr = {https://researchr.org/publication/MondalKRDB22},
  cites = {0},
  citedby = {0},
  journal = {Journal of Circuits, Systems, and Computers},
  volume = {31},
  number = {10},
}