DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits - researchr publication related

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Joyati Mondal, Dipak Kumar Kole, Hafizur Rahaman 0001, Debesh Kumar Das, Bhargab B. Bhattacharya. DFT with Universal Test Set for All Missing Gate Faults in Reversible Circuits. Journal of Circuits, Systems, and Computers, 31(10), 2022. [doi]

The following publications are possibly variants of this publication:

On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test SetHafizur Rahaman, Dipak K. Kole, Debesh Kumar Das, Bhargab B. Bhattacharya. vlsid 2008: 163-168 [doi]

Derivation of test set for detecting multiple missing-gate faults in reversible circuitsDipak K. Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. cee, 39(2):225-236, 2013. [doi]

Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible CircuitsDipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. ised 2011: 200-205 [doi]

Boolean Difference Technique for Detecting All Missing Gate Faults in Reversible CircuitsJoyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das. ddecs 2015: 95-98 [doi]

Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible CircuitsDipak K. Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. ats 2010: 33-38 [doi]

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