Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible Circuits. In International Symposium on Electronic System Design, ISED 2011, Kochi, Kerala, India, December 19-21, 2011. pages 200-205, IEEE, 2011. [doi]
Abstract is missing.