Dipak K. Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 33-38, IEEE Computer Society, 2010. [doi]
Abstract is missing.