The following publications are possibly variants of this publication:
- Derivation of test set for detecting multiple missing-gate faults in reversible circuitsDipak K. Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. cee, 39(2):225-236, 2013. [doi]
- Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible CircuitsDipak Kumar Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. ised 2011: 200-205 [doi]
- On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test SetHafizur Rahaman, Dipak K. Kole, Debesh Kumar Das, Bhargab B. Bhattacharya. vlsid 2008: 163-168 [doi]
- DFT with Universal Test Set for All Missing Gate Faults in Reversible CircuitsJoyati Mondal, Dipak Kumar Kole, Hafizur Rahaman 0001, Debesh Kumar Das, Bhargab B. Bhattacharya. jcsc, 31(10), 2022. [doi]
- Optimum Test Set for Bridging Fault Detection in Reversible CircuitsHafizur Rahaman 0001, Dipak Kumar Kole, Debesh K. Das, Bhargab B. Bhattacharya. ats 2007: 125-128 [doi]