Dipak K. Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya. Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 33-38, IEEE Computer Society, 2010. [doi]
@inproceedings{KoleRDB10,
title = {Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits},
author = {Dipak K. Kole and Hafizur Rahaman and Debesh K. Das and Bhargab B. Bhattacharya},
year = {2010},
doi = {10.1109/ATS.2010.15},
url = {http://dx.doi.org/10.1109/ATS.2010.15},
tags = {testing},
researchr = {https://researchr.org/publication/KoleRDB10},
cites = {0},
citedby = {0},
pages = {33-38},
booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4248-5},
}