Jaekyun Moon, Jaehyeong No, SangChul Lee, Sangsik Kim, Seokhwan Choi, Yunheub Song. Statistical Characterization of Noise and Interference in NAND Flash Memory. IEEE Trans. on Circuits and Systems, 60-I(8):2153-2164, 2013. [doi]
@article{MoonNLKCS13,
title = {Statistical Characterization of Noise and Interference in NAND Flash Memory},
author = {Jaekyun Moon and Jaehyeong No and SangChul Lee and Sangsik Kim and Seokhwan Choi and Yunheub Song},
year = {2013},
doi = {10.1109/TCSI.2013.2239116},
url = {http://dx.doi.org/10.1109/TCSI.2013.2239116},
researchr = {https://researchr.org/publication/MoonNLKCS13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {60-I},
number = {8},
pages = {2153-2164},
}