From Scarcity to Abundance: Expansion Manufacturing Data through Limited Defect Images

Junhyung Moon, Minyeol Yang, Songmi Park, Jongpil Jeong. From Scarcity to Abundance: Expansion Manufacturing Data through Limited Defect Images. In Tung X. Bui, editor, 57th Hawaii International Conference on System Sciences, HICSS 2024, Hilton Hawaiian Village Waikiki Beach Resort, Hawaii, USA, January 3-6, 2024. pages 1027-1036, ScholarSpace, 2024. [doi]

@inproceedings{MoonYPJ24,
  title = {From Scarcity to Abundance: Expansion Manufacturing Data through Limited Defect Images},
  author = {Junhyung Moon and Minyeol Yang and Songmi Park and Jongpil Jeong},
  year = {2024},
  url = {https://hdl.handle.net/10125/106501},
  researchr = {https://researchr.org/publication/MoonYPJ24},
  cites = {0},
  citedby = {0},
  pages = {1027-1036},
  booktitle = {57th Hawaii International Conference on System Sciences, HICSS 2024, Hilton Hawaiian Village Waikiki Beach Resort, Hawaii, USA, January 3-6, 2024},
  editor = {Tung X. Bui},
  publisher = {ScholarSpace},
  isbn = {978-0-9981331-7-1},
}