From Scarcity to Abundance: Expansion Manufacturing Data through Limited Defect Images

Junhyung Moon, Minyeol Yang, Songmi Park, Jongpil Jeong. From Scarcity to Abundance: Expansion Manufacturing Data through Limited Defect Images. In Tung X. Bui, editor, 57th Hawaii International Conference on System Sciences, HICSS 2024, Hilton Hawaiian Village Waikiki Beach Resort, Hawaii, USA, January 3-6, 2024. pages 1027-1036, ScholarSpace, 2024. [doi]

Abstract

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