Influence of the turn-on mechanism on TRIACs reliability: di/dt thermal fatigue study in Q1 compared to Q2

S. Moreau, S. Forster, T. Lequeu, R. Jérisian. Influence of the turn-on mechanism on TRIACs reliability: di/dt thermal fatigue study in Q1 compared to Q2. Microelectronics Reliability, 42(9-11):1663-1666, 2002. [doi]

Authors

S. Moreau

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S. Forster

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T. Lequeu

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R. Jérisian

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