Influence of the turn-on mechanism on TRIACs reliability: di/dt thermal fatigue study in Q1 compared to Q2

S. Moreau, S. Forster, T. Lequeu, R. Jérisian. Influence of the turn-on mechanism on TRIACs reliability: di/dt thermal fatigue study in Q1 compared to Q2. Microelectronics Reliability, 42(9-11):1663-1666, 2002. [doi]

Abstract

Abstract is missing.