A complete methodology for assessing GaN behaviour for military applications

C. Moreau, M. Le Pipec, S. Tence, J. Hemery, J. Rigo, C. Guérin, D. Ruelloux, C. Schneider, P. Le Helleye. A complete methodology for assessing GaN behaviour for military applications. Microelectronics Reliability, 50(9-11):1587-1592, 2010. [doi]

Abstract

Abstract is missing.