Characterization of Hysteresis in SOI-Based Super-Steep Subthreshold Slope FETs

Takayuki Mori, Jiro Ida, Shota Inoue, Takahiro Yoshida. Characterization of Hysteresis in SOI-Based Super-Steep Subthreshold Slope FETs. IEICE Transactions, 101-C(5):334-337, 2018. [doi]

Authors

Takayuki Mori

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Jiro Ida

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Shota Inoue

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Takahiro Yoshida

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