Characterization of Hysteresis in SOI-Based Super-Steep Subthreshold Slope FETs

Takayuki Mori, Jiro Ida, Shota Inoue, Takahiro Yoshida. Characterization of Hysteresis in SOI-Based Super-Steep Subthreshold Slope FETs. IEICE Transactions, 101-C(5):334-337, 2018. [doi]

Abstract

Abstract is missing.