Yu Moriyasu, Takashi Shibata 0001, Masayuki Tanaka 0001, Masatoshi Okutomi. Top-K Confidence Map Aggregation for Robust Semantic Segmentation Against Unexpected Degradation. In IEEE International Conference on Consumer Electronics, ICCE 2023, Las Vegas, NV, USA, January 6-8, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.