Sean P. Morley, Ralph Marlett. Selectable Length Partial Scan: A Method to Reduce Vector Length. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 385-392, IEEE Computer Society, 1991.
@inproceedings{MorleyM91,
title = {Selectable Length Partial Scan: A Method to Reduce Vector Length},
author = {Sean P. Morley and Ralph Marlett},
year = {1991},
researchr = {https://researchr.org/publication/MorleyM91},
cites = {0},
citedby = {0},
pages = {385-392},
booktitle = {Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
publisher = {IEEE Computer Society},
isbn = {0-8186-9156-5},
}