Clémence Mornet, Jérôme Vaillant, Thomas Decroux, Didier Hérault, Isabelle Schanen. Evaluation of color error and noise on simulated images. In Francisco H. Imai, Nitin Sampat, Feng Xiao, editors, Digital Photography VI, part of the IS&T-SPIE Electronic Imaging Symposium, San Jose, CA, USA, January 18-19, 2010, Proceedings. Volume 7537 of SPIE Proceedings, pages 75370, SPIE, 2010. [doi]
Abstract is missing.