Bayesian Model for Trustworthiness Analysis of Deep Learning Classifiers

Andrey Morozov, Emil Valiev, Michael Beyer, Kai Ding, Lydia Gauerhof, Christoph Schorn. Bayesian Model for Trustworthiness Analysis of Deep Learning Classifiers. In Huáscar Espinoza, John McDermid, Xiaowei Huang 0001, Mauricio Castillo-Effen, Xin Cynthia Chen, José Hernández-Orallo, Seán Ó hÉigeartaigh, Richard Mallah, editors, Proceedings of the Workshop on Artificial Intelligence Safety 2020 co-located with the 29th International Joint Conference on Artificial Intelligence and the 17th Pacific Rim International Conference on Artificial Intelligence (IJCAI-PRICAI 2020), Yokohama, Japan, January, 2021. Volume 2640 of CEUR Workshop Proceedings, CEUR-WS.org, 2020. [doi]

Abstract

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