Despina C. Moschou, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas. On the importance of the V::g, max::-V::th:: parameter on LTPS TFT stressing behavior. Microelectronics Reliability, 50(2):190-194, 2010. [doi]
@article{MoschouKKV10,
title = {On the importance of the V::g, max::-V::th:: parameter on LTPS TFT stressing behavior},
author = {Despina C. Moschou and Giannis P. Kontogiannopoulos and Dimitrios N. Kouvatsos and Apostolos T. Voutsas},
year = {2010},
doi = {10.1016/j.microrel.2009.10.014},
url = {http://dx.doi.org/10.1016/j.microrel.2009.10.014},
tags = {C++},
researchr = {https://researchr.org/publication/MoschouKKV10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {2},
pages = {190-194},
}