On the importance of the V::g, max::-V::th:: parameter on LTPS TFT stressing behavior

Despina C. Moschou, Giannis P. Kontogiannopoulos, Dimitrios N. Kouvatsos, Apostolos T. Voutsas. On the importance of the V::g, max::-V::th:: parameter on LTPS TFT stressing behavior. Microelectronics Reliability, 50(2):190-194, 2010. [doi]