Stephen Moss, Elanchezhian Veeramani, Joris Angelo Sundaram Jerome. Passive Intermodulation (PIM) Test and Measurement. In 29th IEEE North Atlantic Test Workshop, NATW 2020, Albany, NY, USA, June 17-24, 2020. pages 1-3, IEEE, 2020. [doi]
@inproceedings{MossVJ20,
title = {Passive Intermodulation (PIM) Test and Measurement},
author = {Stephen Moss and Elanchezhian Veeramani and Joris Angelo Sundaram Jerome},
year = {2020},
doi = {10.1109/NATW49237.2020.9153075},
url = {https://doi.org/10.1109/NATW49237.2020.9153075},
researchr = {https://researchr.org/publication/MossVJ20},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {29th IEEE North Atlantic Test Workshop, NATW 2020, Albany, NY, USA, June 17-24, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9699-2},
}