Abstract is missing.
- Verification and Testing Considerations of an In-Memory AI ChipMarcia Golmohamadi, Ryan Jurasek, Wolfgang Hokenmaier, Donald Labrecque, Ruoyu Zhi, Bret Dale, Nibir Islam, Dave Kinney, Angela Johnson. 1-6 [doi]
- Self-heating characterization and its applications in technology developmentPeter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, F. Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, O. H. Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, S. Rauch, B. Min. 1-7 [doi]
- Calculating Signal Controllability using Neural Networks: Improvements to Testability Analysis and Test Point InsertionJoshua Immanuel, Spencer K. Millican. 1-6 [doi]
- AI Powered THz VLSI Testing TechnologyNaznin Akter, Mustafa Karabiyik, Michael S. Shur, John Suarez, Nezih Pala. 1-5 [doi]
- Passive Intermodulation (PIM) Test and MeasurementStephen Moss, Elanchezhian Veeramani, Joris Angelo Sundaram Jerome. 1-3 [doi]
- Characterization of Thermal Runaway in a Ge Photodiode for Si PhotonicsStewart Rauch, Dongho Lee, Alexey Vert, Roy Gupta. 1-4 [doi]
- A Built In Test circuit for waveform classification at high frequenciesKonstantinos Poulos, Themistoklis Haniotakis. 1-5 [doi]