Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, F. Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, O. H. Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, S. Rauch, B. Min. Self-heating characterization and its applications in technology development. In 29th IEEE North Atlantic Test Workshop, NATW 2020, Albany, NY, USA, June 17-24, 2020. pages 1-7, IEEE, 2020. [doi]
Abstract is missing.