Hassan Mostafa, Mohab Anis, Mohamed I. Elmasry. A Bias-Dependent Model for the Impact of Process Variations on the SRAM Soft Error Immunity. IEEE Trans. VLSI Syst., 19(11):2130-2134, 2011. [doi]
@article{MostafaAE11b,
title = {A Bias-Dependent Model for the Impact of Process Variations on the SRAM Soft Error Immunity},
author = {Hassan Mostafa and Mohab Anis and Mohamed I. Elmasry},
year = {2011},
doi = {10.1109/TVLSI.2010.2068317},
url = {http://dx.doi.org/10.1109/TVLSI.2010.2068317},
researchr = {https://researchr.org/publication/MostafaAE11b},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {19},
number = {11},
pages = {2130-2134},
}