Fault Coverage of UIO-based Methods for Protocol Testing - researchr publication authors

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Howard E. Motteler, Anthony Chung, Deepinder P. Sidhu. Fault Coverage of UIO-based Methods for Protocol Testing. In Omar Rafiq, editor, Protocol Test Systems, VI, Proceedings of the IFIP TC6/WG6.1 Sixth International Workshop on Protocol Test systems, Pau, France, 28-30 September, 1993. Volume C-19 of IFIP Transactions, pages 21-34, North-Holland, 1993.

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