Howard E. Motteler, Anthony Chung, Deepinder P. Sidhu. Fault Coverage of UIO-based Methods for Protocol Testing. In Omar Rafiq, editor, Protocol Test Systems, VI, Proceedings of the IFIP TC6/WG6.1 Sixth International Workshop on Protocol Test systems, Pau, France, 28-30 September, 1993. Volume C-19 of IFIP Transactions, pages 21-34, North-Holland, 1993.
@inproceedings{MottelerCS93,
title = {Fault Coverage of UIO-based Methods for Protocol Testing},
author = {Howard E. Motteler and Anthony Chung and Deepinder P. Sidhu},
year = {1993},
tags = {rule-based, test coverage, protocol, testing, e-science, coverage},
researchr = {https://researchr.org/publication/MottelerCS93},
cites = {0},
citedby = {0},
pages = {21-34},
booktitle = {Protocol Test Systems, VI, Proceedings of the IFIP TC6/WG6.1 Sixth International Workshop on Protocol Test systems, Pau, France, 28-30 September, 1993},
editor = {Omar Rafiq},
volume = {C-19},
series = {IFIP Transactions},
publisher = {North-Holland},
isbn = {0-444-81697-6},
}